1.北美市場方面，認證機構UL，針對固態過電流保護器產品，於2009年年底正式發行UL2367標準，全名為Solid State Over current Protectors其對應之產品類別碼CCN (Category Code Number) 分別為QVGS2及QVRQ2。
1.1 UL2367常見檢測項目為Sec.10-Sec.18，共計9項，分別為
Sec.10 Calibration Tests
Sec.11 Temperature Test
Sec.12 Overload Operation Test
Sec.13 Short Circuit Test
Sec.14 Shipping and Storage Test
Sec.15 Thermal Cycling Test
Sec.16 Endurance Test
Sec.17 Abnormal Test
Sec.18 Long Term Abnormal Test
其中Sec10為校對試驗，要求串接3A快斷保險絲於地端，並於負載側(Load Side)，施加6.75A/10A及210%之電流並比對作動時間，為一基本且重要試驗。
1.2 目前僅能於美國本土UL實驗室進行相關檢測認證，現今之檢測週期長達半年以上，有必要取得該認證業者應儘早安排規劃因應。
2.於全球市場方面，關於積體電路(IC)形式之過電流保護器，國際電工協會(IEC)目前是 以IEC60950-1為檢測標準並藉由CB架構核發CB報告及證書。
2.1 該適用法規IEC60950-1，目前適用2版本，其中2010版之附錄Annex C C，增列了加測項目如下(兩者擇一)：
CC.2 Test program 1
Test program 1 consists of the following:
− 10 000 cycles of turning enable on and off with a 100 ± 5 resistor and a 425 F ± 10 F capacitor in parallel with the output;
− 10 000 cycles of turning enable on and off with an iron-core inductor having 350 mH ± 10 mH inductance at 1 kHz and 10 ± 2 d.c. resistance connected in the output circuit;
− 10 000 cycles of turning enable on and off with the input connected to a capacitor rated 425 F ± 1 F and shorting the output;
− 10 000 cycles of turning the input pin on and off with a capacitor rated 425 F ± 10 F connected to the input supply while keeping enable active and shorting the output;
− 10 000 cycles of turning the input pin on and off with an iron-core inductor having 350 mH ± 10 mH inductance at 1 kHz and 10 ± 2 d.c. resistance connected to the input supply and return while keeping enable active and shorting the output;
− 50 cycles with the enable pin held active with the output open-circuited, each cycle consisting of shorting the output and then opening the output;
− 50 cycles with the enable pin held active while applying a short to the output, each cycle consisting of turning the power on and off;
− 50 cycles with the enable pin held active while power is applied, each cycle consisting of shorting the output, removing power, reapplying power, removing the short, followed by removal of power.
CC.3 Test program 2
Test program 2 consists of the following:
− 50 cycles with the enable pin held active with the output open-circuited; each cycle consisting of shorting the output and then opening the output;
− 50 cycles with the enable pin held active while applying a short to the output; each cycle consisting of turning the power on and off;
− 50 cycles with the enable pin held active with the output loaded to maximum power, each cycle consisting of turning the power on and off;
− 50 cycles with the enable pin held active while power is applied, each cycle consisting of shorting the output, removing power, reapplying power, removing the short, followed by removal of power;
− 3 cycles of exposing the device (not energized) to 70 oC ± 2 oC for 24 h; followed by at least 1 h at room ambient; followed by at least 3 h at -30 oC ± 2 oC; followed by 3 h at room ambient;
− 10 cycles of exposing the device (while energized) to 50 oC ± 2 oC for 10 min; followed by 10 min at 0 oC ± 2 oC with a 5 min period of transition from one state to the other;
舊規IEC60950-1: 2005 則無此一加測條款，而新/ 舊規一樣可受理申請 (惟舊規恐因時間、客戶指定版本因素日漸被取代, 但無失效問題)，然而若使用新規申請, 則費用較舊規增加且有較高檢測失敗風險，重測費用亦另計。